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Seminar Title
Essential patent indicators for the evaluation of industrial technological innovation competitiveness
Year
93
Semester
1
Published date
2005-01-01
Seminar Name
Seminar Name Other
All Author
Chen, Dar-zen; Lin, Wen-yau Cathy
The Unit Of The Conference
淡江大學資訊與圖書館學系
Publisher
Karolinska University
Meeting Name
Meeting Place
Summary
The article aims to develop essential patent indicators for evaluating the technological innovation competitiveness between industrials or companies. Citations of certain patent cited by specific company and cited year both contribute to meaningful evaluation outcomes. A novel indicator for representing an industrial's patent performance, Essential Patent Index(EPI), was develpoed first by setting weight factors in who cited these patents and when these patents were cited. By combining EPI and Chi's well-known Technological Strengh(TS) indicator, a second novel indicator Essential Technological Strengh(ETS) was developed to represent a company's innovation competitiveness. In this casestudy, patent performances of three high-tech industries in Taiwan were analyzed using ETS as well as the traditional TS for comparision. Results from this analysis demonstrated that ETS provided better insights by clear verifying the latent influence of citations, enforcing the impact of essential patents, and aggrandizing the innovation competitiveness differences between companies.
Keyword
Use Lang
English
Included in
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On-campus Seminar Location
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Open Call for Papers
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Provenance
Proceedings of ISSI 2005-the 10th International Conference of the International Society for Scientometrics and Informetrics, pp.490-498