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    TitleUsing essential patent index and essential technological strength to evaluate industrial technological innovation competitiveness
    Year95
    Semester2
    Publish Date2007/04/01
    Journal NameUsing essential patent index and essential technological strength to evaluate industrial technological innovation competitiveness
    Journal Name Other
    All AuthorChen, Dar-zen; Lin, Wen-yau Cathy; Huang, Mu-Hsuan
    Unit淡江大學資訊與圖書館學系
    Publisher
    VolumeScientometrics 71(1), p.101-116
    SummaryThe aim of this article is to develop new patent indicators for evaluating technological innovation competitiveness between companies. A novel indicator representing an industrial's patent performance, Essential Patent Index (EPI), was developed by incorporating information on who cited these patents and when these patents were cited, based on the assumption that both contribute to meaningful quality assessment. By combining EPI and Chi's well known Technological Strength (TS) indicator, a second novel indicator Essential Technological Strength (ETS) was developed to represent the innovation competitiveness of an individual company. In this study, patent performance of three high-tech industries in Taiwan were analyzed using ETS as well as the traditional TS for comparison. Results from this analysis demonstrated that ETS provided better insights by clearly verifying the latent influence of citations, reinforcing the impact of essential patents, and aggrandizing the differences of innovation competitiveness between companies.
    KeywordPatent Citation;Patent Indicator;Patent Quality;Global Competitiveness Report;Utility Patent
    Use LangEnglish
    ISSN0138-9130
    Journalnature國外
    Included in,SCI,SSCI
    UniversityCooperation
    CorrespondingAuthorHuang, Mu-hsuan
    Reviewsystem
    Country匈牙利
    Open Call for Papers
    PublicationStyle電子版,紙本